International Conference on Automatic Inspection and Measurement:August 20-21, 1985, San Diego, California
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Corporate Authors: | ; ; ; ; |
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Group Author: | ; |
Published: |
SPIE--International Society for Optical Engineering,
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Publisher Address: | Bellingham, Wash., USA |
Publication Dates: | c1985. |
Literature type: | Book |
Language: | English |
Series: |
Proceedings of SPIE--the International Society for Optical Engineering ; v. 557 |
Subjects: | |
Carrier Form: | vi, 176 p.: ill. ; 28 cm. |
ISBN: | 0892525924 (pbk.) |
Index Number: | TP274 |
CLC: | TP274-532 |
Call Number: | TP274-53/I61.8/1985/ |
Contents: | Includes bibliographies and index. |