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International Conference on Automatic Inspection and Measurement：August 20-21, 1985, San Diego, California

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Bibliographic Details
Corporate Authors: International Conference on Automatic Inspection and Measurement (1985 San Diego, Calif; Sira Limited; University of Arizona. Optical Sciences Center; University of Rochester. Institute of Optics; Society of Photo-Optical Instrumentation Engineers
Group Author: Brook Richard A; Chen Michael J. W
Published: SPIE--International Society for Optical Engineering,
Publisher Address: Bellingham, Wash., USA
Publication Dates: c1985.
Literature type: Book
Language: English
Series: Proceedings of SPIE--the International Society for Optical Engineering ; v. 557
Subjects:
Engineering inspection > Automation > Congresses
Quality control > Optical methods > Congresses
Carrier Form: vi, 176 p.: ill. ; 28 cm.
ISBN: 0892525924 (pbk.)
Index Number: TP274
CLC: TP274-532
Call Number: TP274-53/I61.8/1985/
Contents: Includes bibliographies and index.

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