Dimensional optical metrology and inspection for practical applications V : 20 April 2016, Baltimore, Maryland, United States /
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Corporate Authors: | |
---|---|
Group Author: | ; |
Published: |
SPIE,
|
Publisher Address: | Bellingham, Washington : |
Publication Dates: | [2016] |
Literature type: | Book |
Language: |
English Undetermined |
Series: |
Proceedings of SPIE,
volume 9868 |
Subjects: | |
Item Description: | "SPIE Defense + Commercial Sensing" -- Cover. |
Carrier Form: | 1 volume (various pagings) : illustrations, forms ; 28 cm. |
Bibliography: | Includes bibliographical references. |
ISBN: |
9781510601093 (paperback) : 1510601090 (paperback) |
CLC: | TB96-532 |
Call Number: | TB96-532/D582/2016 |