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Advances in X-ray analysis.. Volume 31

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Bibliographic Details
Corporate Authors: JCPDS--International Centre for Diffraction Data.; Conference on Applications of X-ray Analysis 1987 Denver, Colo.) (Denver, Colo.)); University of Denver. Dept. of Engineering.
Group Author: (Charles Sanborn), 1902-; Barrett C. S.
Published: Plenum Press,
Publisher Address: New York
Publication Dates: c1988.
Literature type: Book
Language: English
Subjects:
X-ray spectroscopy.
X RAY ANALYSIS
X RAYS
Industries
NONDESTRUCTIVE TESTS
MICROBEAMS
X RAY IMAGERY
IMAGING TECHNIQUES
Thin films
CONFERENCES
X-rays > Industrial applications.
Carrier Form: xvii, 523 p.: ill. ; 26 cm.
ISBN: 0306429322
Index Number: O434
CLC: O434.19-1
Call Number: TA406.5
O434.19-1/A244/
Contents: "Proceedings of the Thirty-sixth Annual Conference on Applications of X-ray Analysis held August 3-7, 1987, in Denver, Colorado"--T.p. verso.
Includes bibliographical references and indexes.

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