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Fringe pattern analysis：8-9 August 1989, San Diego, California

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Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumention Engineers; SPIE Conference on Fringe Pattern Analysis 1989 San Diego, Calif.) (San Diego, Calif.))
Group Author: Reid Graeme T
Published: SPIE,
Publisher Address: Bellingham, Wash., USA
Publication Dates: c1989.
Literature type: Book
Language: English
Series: Proceedings / SPIE--the International Society for Optical Engineering ; v. 1163
Subjects:
Image processing > Congresses
Diffraction patterns
Interferometry
SPECKLE INTERFEROMETRY
Image processing
CONFERENCES
Diffraction patterns > Congresses
Interferometry > Congresses
Carrier Form: vi, 260 p.: ill. ; 28 cm.
ISBN: 0819401994
Index Number: O436
CLC: O436.1-532
Call Number: O436.1-53/F914/1989/
Contents: "Papers presented at the First SPIE Conference on Fringe Pattern Analysis"--Introd.
Includes bibliographical references and index.

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