Screen LibraryBuilt-in-self-test and digital self-calibration for RF SoCs
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| Main Authors: | |
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| Corporate Authors: | |
| Group Author: | |
| Published: |
Springer,
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| Publisher Address: | New York, NY |
| Publication Dates: | c2012. |
| Literature type: | Book |
| Language: | English |
| Series: |
SpringerBriefs in electrical and computer engineering |
| Subjects: | |
| Online Access: |
http://dx.doi.org/10.1007/978-1-4419-9548-3 |
| Carrier Form: | 1 online resource (xvii, 89 p.): |
| ISBN: |
9781441995483 (electronic bk.) 144199548X (electronic bk.) |
| Index Number: | TN85 |
| CLC: | TN85 |
| Contents: | Includes bibliographical references. |