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分析晶体缺陷的电子显微术

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Bibliographic Details
Main Authors: 洛雷托 (著); 斯莫尔曼 (著)
Group Author: 康振川 (译); 王桂金 (译)
Published: 上海科学技术出版社
Publisher Address: 上海
Publication Dates: 1979
Literature type: Book
Language: Chinese
Subjects:
晶体缺陷—分析—电子显微术
电子显微术—晶体缺陷—分析
Carrier Form: 111页: ; 20cm
Index Number: O77
CLC: O77
Call Number: O77/3115

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