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2012 IEEE International Conference on Microelectronic Test Structures：ICMTS 2012 : San Diego, California, 19-22 March , 2012

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Bibliographic Details
Corporate Authors: IEEE International Conference on Microelectronic Test Structures (2012 San Diego, Calif; IEEE Electron Devices Society
Published: IEEE,
Publisher Address: Piscataway, NJ
Publication Dates: c2012.
Literature type: Book
Language: English
Subjects:
Integrated circuits > Testing
Semiconductors > Testing
Electronic apparatus and appliances > Testing
Carrier Form: 256 p.: ill. ; 27 cm.
ISBN: 9781467310277
1467310271
Index Number: TN407
CLC: TN407-532
Call Number: TN407-532/I61/2012
Contents: "IEEE Catalog Number : CFP12MTS-PRT".
Includes bibliographical references.

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