Optoelectronic measurement technology and systems : 2013 International Conference on Optical Instruments and Technology, 17-19 November 2013, Beijing, China /

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Bibliographic Details
Corporate Authors: SPIE Society; China Instrument and Control Society; International Conference on Optical Instruments and Technology
Group Author: Tam, Hwa-Yaw
Published: SPIE,
Publisher Address: Bellingham, Washington :
Publication Dates: [2013]
Literature type: Book
Language: English
Series: Proceedings of SPIE, volume 9046
Subjects:
Carrier Form: 1 volume (various pagings) : illustrations (black and white) ; 28 cm.
Bibliography: Includes bibliographical references and author index.
ISBN: 9780819499646 (paperback) :
0819499641
CLC: TH74-532
Call Number: TH74-532/I614-6/2013