Optoelectronic measurement technology and systems : 2013 International Conference on Optical Instruments and Technology, 17-19 November 2013, Beijing, China /

Corporate Authors: SPIE Society; China Instrument and Control Society; International Conference on Optical Instruments and Technology
Group Author: Tam, Hwa-Yaw
Published: SPIE,
Publication Dates: [2013]
Call Number: TH74-532/I614-6/2013