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Defect-oriented testing for nano-metric CMOS VLSI circuits

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Bibliographic Details
Main Authors: Sachdev Manoj
Group Author: Pineda de Gyvez José
Published: Springer,
Publisher Address: Dordrecht
Publication Dates: c2007.
Literature type: Book
Language: English
Edition: 2nd ed.
Series: Frontiers in electronic testing ; 34
Subjects:
Metal oxide semiconductors, Complementary > Defects
Integrated circuits > Very large scale integration > Testing
Integrated circuits > Very large scale integration > Defects
Metal oxide semiconductors, Complementary > Testing
Item Description: Defect oriented testing for CMOS analog and digital circuits.
Carrier Form: xxi, 328 p.: ill. ; 24 cm.
ISBN: 9780387465463 (hd.bd.)
0387465464 (hd.bd.)
Index Number: TN432
CLC: TN432.07
Call Number: TN432.07/S121/2nd.ed.
Contents: Includes index.
New edition of: Defect oriented testing for CMOS analog and digital circuits, 1998.

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