Author Results for Sachdev Manoj

Sachdev,Manoj
NetLibrary, Inc
Pineda de Gyvez,José
Arman Vassighi and Manoj Sachdev
Pavlov,Andrei
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Sarbishaei,Hossein
Semenov,Oleg
SpringerLink (Online service)
Vassighi,Arman
Vassighi,Arman,

1
Defect oriented testing for CMOS analog and digital circuits

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Main Authors: Sachdev Manoj
Published: Kluwer Academic,
Publication Dates: c1998.
Call Number: TN432.07/S121/
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2
Thermal and power management of integrated circuits

Cover is for reference only
Main Authors: Vassighi Arman 1966-
Group Author: Sachdev Manoj
Published: Springer,
Publication Dates: c2006.
Call Number: TN40/V339
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4
Thermal and power management of integrated circuits

Cover is for reference only
Main Authors: Vassighi Arman, 1966-
Corporate Authors: NetLibrary, Inc.
Group Author: Sachdev Manoj.
Published: Springer,
Publication Dates: c2006.
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5
ESD protection device and circuit design for advanced CMOS technologies

Cover is for reference only
Main Authors: Semenov Oleg.
Corporate Authors: NetLibrary, Inc.
Group Author: Sachdev Manoj.; Sarbishaei Hossein.
Published: Springer,
Publication Dates: c2008.
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6
Defect-oriented testing for nano-metric CMOS VLSI circuits

Cover is for reference only
Main Authors: Sachdev Manoj
Group Author: Pineda de Gyvez José
Published: Springer,
Publication Dates: c2007.
Call Number: TN432.07/S121/2nd.ed.
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7
Defect-oriented testing for nano-metric CMOS VLSI circuits

Cover is for reference only
Main Authors: Sachdev Manoj.
Corporate Authors: SpringerLink (Online service)
Group Author: Pineda de Gyvez José.
Published: Springer,
Publication Dates: c2007.
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