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Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California

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Bibliographic Details
Corporate Authors: IEEE International Workshop on Memory Technology, Design, and Testing (1995 San Jose, Calif.); IEEE Computer Society. Technical Committee on VLSI.; IEEE Solid-State Circuits Council; IEEE Computer Society. Test Technology Technical Committee.
Group Author: Rajkanan K.; (Kamal); Rajsuman Rochit.
Published: IEEE Computer Society Press,
Publisher Address: Los Alamitos, Calif.
Publication Dates: c1995.
Literature type: Book
Language: English
Subjects:
Random access memory.
Semiconductor storage devices > Testing.
Carrier Form: ix, 129 p.: ill. ; 28 cm.
Publication Frequency: Also available via the World Wide Web with additional title: Memory Technology, Design and Testing, 1995, records of the 1995 IEEE International Workshop on.
ISBN: 0818671025
Index Number: TP333
CLC: TP333-532
TP333.5-532
Call Number: TP333.5-532/I59.1/1995
Contents: "IEEE catalog number 95TH8065"--T.p. verso.
Includes bibliographical references and index.

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