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International Test Conference 2003：proceedings, [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA

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Bibliographic Details
Corporate Authors: International Test Conference (34th 2003 Charlotte, N.C; IEEE Computer Society. Test Technology Technical Committee; Institute of Electrical and Electronics Engineers. Philadelphia Section
Published: International Test Conference IEEE,
Publisher Address: Washington, D.C. Piscataway, N.J.
Publication Dates: c2003.
Literature type: Book
Language: English
Subjects:
Integrated circuits > Testing
Electronic digital computers > Circuits > Testing
Telecommunication
Radio frequency
Carrier Form: xvi, 1334 p.: ill. ; 29 cm.
Publication Frequency: Also available via the World Wide Web.
ISBN: 0780381068
Index Number: TP306
CLC: TP306-532
TN06-532
Call Number: TP306-532/I61/2003
Contents: At head of title: ITC International Test Conference 2003
Conference number inferred.
"IEEE Catalog Number 03CH37494"--T.p. verso.
Includes bibliographical references and author index.

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