Screen LibraryProceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
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| Corporate Authors: | |
|---|---|
| Group Author: | |
| Published: |
Electrochemical Society,
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| Publisher Address: | Pennington, NJ |
| Publication Dates: | c1997. |
| Literature type: | Book |
| Language: | English |
| Series: |
Proceedings / Electrochemical Society ; v. 97-12 |
| Subjects: | |
| Carrier Form: | ix, 478 p.: ill. ; 24 cm. |
| ISBN: | 1566771390 |
| Index Number: | TN304 |
| CLC: |
TN304.07-532 TN303-532 TN307-532 |
| Call Number: | TN304.07-532/E38/1997/ |
| Contents: |
"Sponsored by the Electrochemical Society, Inc., Electronics ; published in cooperation with: the International Society for Optical Engineering." The symposium was held on May 6-8, 1997 in Montreal, Canada. Includes bibliographical references and indexes. |