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Discrete semiconductor reliability：transistor/diode data

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Bibliographic Details
Main Authors: Walker Roy C (prepared by Roy C. Walker, David B. Nicholls, Reliability Analysis Center (IIT Research Institute).)
Corporate Authors: IIT Research Institute; Reliability Analysis Center U.S
Group Author: Nicholls David B (joint author.)
Published: Reliability Analysis Center, Rome Air Development Center,
Publisher Address: Griffiss Air Force Base, N.Y.
Publication Dates: 1977.
Literature type: Book
Language: English
Edition: [2nd ed.]
Subjects:
Semiconductors > Reliability
Transistors > Reliability
Diodes, Semiconductor
Carrier Form: viii, 304 p.: ; 28 cm.
Index Number: TN32
CLC: TN32
Call Number: TN32/R382/
Contents: Chiefly tables.
On spine: Transistor/diode data.
Catalog no. DSR-2.

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