Discrete semiconductor reliability:transistor/diode data
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Main Authors: | |
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Corporate Authors: | ; |
Group Author: | |
Published: |
Reliability Analysis Center, Rome Air Development Center,
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Publisher Address: | Griffiss Air Force Base, N.Y. |
Publication Dates: | 1977. |
Literature type: | Book |
Language: | English |
Edition: | [2nd ed.] |
Subjects: | |
Carrier Form: | viii, 304 p.: ; 28 cm. |
Index Number: | TN32 |
CLC: | TN32 |
Call Number: | TN32/R382/ |
Contents: |
Chiefly tables. On spine: Transistor/diode data. Catalog no. DSR-2. |