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Test and design-for-testability in mixed-signal integrated circuits

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Bibliographic Details
Group Author: Huertas Josae L.; (Josae Luis)
Published: Kluwer Academic,
Publisher Address: Boston, Mass. London
Publication Dates: c2004.
Literature type: Book
Language: English
Subjects:
Mixed signal circuits > Design and construction.
Integrated circuits > Verification.
Mixed signal circuits > Testing.
Carrier Form: xiv, 298 p.: ill. ; 25 cm.
ISBN: 1402077246
Index Number: TN433
CLC: TN433.02
Call Number: TN433.02/T342
Contents: Includes bibliographical references.
Mixed-signal test / B. Schneider -- Analog and mixed signal test bus : IEEE 1149.4 test standard / F. Aza··is, P. Nouet -- Test of A/D converters / A. Lechner, A. Richardson -- Phased locked loop test methodologies / M.J. Burbidge, A. Richardson -- Behavioral testing of mixed-signal circuits / V. Loukusa -- Behavioral modeling of multistage ADCs and its use for design, calibration and test / E.J. Peralaias, A. Rueda -- DFT and BIST techniques for embedded analog integrated filters / D. Vaasquez-Garcaia -- Oscillation-based test strategies / G. Huertas ... [et al.].

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