Test and design-for-testability in mixed-signal integrated circuits
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Group Author: | ; |
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Published: |
Kluwer Academic,
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Publisher Address: | Boston, Mass. London |
Publication Dates: | c2004. |
Literature type: | Book |
Language: | English |
Subjects: | |
Carrier Form: | xiv, 298 p.: ill. ; 25 cm. |
ISBN: | 1402077246 |
Index Number: | TN433 |
CLC: | TN433.02 |
Call Number: | TN433.02/T342 |
Contents: |
Includes bibliographical references. Mixed-signal test / B. Schneider -- Analog and mixed signal test bus : IEEE 1149.4 test standard / F. Aza··is, P. Nouet -- Test of A/D converters / A. Lechner, A. Richardson -- Phased locked loop test methodologies / M.J. Burbidge, A. Richardson -- Behavioral testing of mixed-signal circuits / V. Loukusa -- Behavioral modeling of multistage ADCs and its use for design, calibration and test / E.J. Peralaias, A. Rueda -- DFT and BIST techniques for embedded analog integrated filters / D. Vaasquez-Garcaia -- Oscillation-based test strategies / G. Huertas ... [et al.]. |