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Microcircuit device reliability：linear/interface data

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Bibliographic Details
Main Authors: Flint Steven J
Corporate Authors: Reliability Analysis Center U.S; Rome Air Development Center
Published: Reliability Analysis Center, Rome Air Development Center,
Publisher Address: Griffiss AFB, N.Y.
Publication Dates: 1979.
Literature type: Book
Language: English
Subjects:
Microelectronics
Microelectronics > Reliability
Integrated circuits > Reliability
Carrier Form: ix, 262 p.: ill. ; 27 cm.
Index Number: TN4
CLC: TN4-64
Call Number: TN4-64/R382/1979/
Contents: "Spring 1979."
"Ordering no. MDR-11."

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