Microcircuit device reliability:linear/interface data
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Main Authors: | |
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Corporate Authors: | ; |
Published: |
Reliability Analysis Center, Rome Air Development Center,
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Publisher Address: | Griffiss AFB, N.Y. |
Publication Dates: | 1979. |
Literature type: | Book |
Language: | English |
Subjects: | |
Carrier Form: | ix, 262 p.: ill. ; 27 cm. |
Index Number: | TN4 |
CLC: | TN4-64 |
Call Number: | TN4-64/R382/1979/ |
Contents: |
"Spring 1979." "Ordering no. MDR-11." |