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ITC International Test Conference 2004：proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA

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Bibliographic Details
Corporate Authors: International Test Conference (35th 2004 Charlotte, N.C; IEEE Computer Society. Test Technology Technical Committee; Institute of Electrical and Electronics Engineers. Philadelphia Section
Published: International Test Conference IEEE,
Publisher Address: Washington, D.C. Piscataway, N.J.
Publication Dates: c2004.
Literature type: Book
Language: English
Subjects:
Integrated circuits > Testing
Electronic digital computers > Circuits > Testing
Telecommunication
Radio frequency
Carrier Form: xvi, 1459 p.: ill. ; 27 cm.
Publication Frequency: Also available via the World Wide Web.
ISBN: 0780385802
Index Number: TN06
CLC: TN06-532
TP306-532
Call Number: TP306-532/I61/2004
Contents: Cover title.
"Conference 35 Years"--cover.
"IEEE Catalog Number 04CH37586"--T.p. verso.
Includes bibliographical references and author index.

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