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Encyclopedia of materials characterization : surfaces, interfaces, thin films /

Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials scie...

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Bibliographic Details
Corporate Authors: Elsevier Science & Technology.
Group Author: Brundle, C. R. (Editor); Evans, Charles A. (Editor); Wilson, Shaun. (Editor)
Published: Butterworth-Heinemann ; Manning,
Publisher Address: Boston : Greenwich, CT :
Publication Dates: 1992.
Literature type: eBook
Language: English
Series: Materials characterization series
Subjects:
Surfaces (Technology) > Testing.
Engenharia metalurgica e de materiais.
Surfaces (Technologie)
Mate riaux > Analyse.
Essais (technologie)
Messtechnik.
Du nne Schicht.
Stoffeigenschaft.
Oberfla cheneigenschaft.
Grenzfla che.
Surfaces > Analysis
Electronic books.
Online Access: http://www.sciencedirect.com/science/book/9780080523606
Summary: Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.
Carrier Form: 1 online resource (xix, 751 pages) : illustrations.
Bibliography: Includes bibliographical references and index.
ISBN: 1591245028
9781591245025
9780080523606
0080523609
Index Number: TA418
CLC: TB3-61
Contents: Introduction and summaries -- Imaging techniques (Microscopy) -- Electron beam instruments -- Structure determination by diffraction and scattering -- Electron emission spectroscopies -- X-ray emission techniques -- Visible/UV emission, reflection, and absorption -- Vibrational spectroscopies and NMR -- Ion scattering techniques -- Mass and optical spectroscopies -- Neutron and nuclear techniques -- Physical and magnetic properties.

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