Encyclopedia of materials characterization : surfaces, interfaces, thin films /
Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials scie...
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Corporate Authors: | |
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Group Author: | ; ; |
Published: |
Butterworth-Heinemann ; Manning,
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Publisher Address: | Boston : Greenwich, CT : |
Publication Dates: | 1992. |
Literature type: | eBook |
Language: | English |
Series: |
Materials characterization series
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Subjects: | |
Online Access: |
http://www.sciencedirect.com/science/book/9780080523606 |
Summary: |
Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities. |
Carrier Form: | 1 online resource (xix, 751 pages) : illustrations. |
Bibliography: | Includes bibliographical references and index. |
ISBN: |
1591245028 9781591245025 9780080523606 0080523609 |
Index Number: | TA418 |
CLC: | TB3-61 |
Contents: | Introduction and summaries -- Imaging techniques (Microscopy) -- Electron beam instruments -- Structure determination by diffraction and scattering -- Electron emission spectroscopies -- X-ray emission techniques -- Visible/UV emission, reflection, and absorption -- Vibrational spectroscopies and NMR -- Ion scattering techniques -- Mass and optical spectroscopies -- Neutron and nuclear techniques -- Physical and magnetic properties. |