Electron and ion microscopy and microanalysis:principles and applications
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Main Authors: | |
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Published: |
Marcel Dekker,
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Publisher Address: | New York |
Publication Dates: | c1982. |
Literature type: | Book |
Language: | English |
Series: |
Optical engineering ; v. 1 |
Subjects: | |
Carrier Form: | xiv, 793 p.: ill. ; 27 cm. |
ISBN: | 0824715535 |
Index Number: | TN153 |
CLC: | TN153 |
Call Number: | TN153/M979/ |
Contents: | Includes bibliographical references and indexes. |