Screen LibraryElectron and ion microscopy and microanalysis：principles and applications
Saved in:
| Main Authors: | |
|---|---|
| Published: |
Marcel Dekker,
|
| Publisher Address: | New York |
| Publication Dates: | c1982. |
| Literature type: | Book |
| Language: | English |
| Series: |
Optical engineering ; v. 1 |
| Subjects: | |
| Carrier Form: | xiv, 793 p.: ill. ; 27 cm. |
| ISBN: | 0824715535 |
| Index Number: | TN153 |
| CLC: | TN153 |
| Call Number: | TN153/M979/ |
| Contents: | Includes bibliographical references and indexes. |