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Terrestrial radiation effects in ULSI devices and electronic systems /

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Bibliographic Details
Main Authors: Ibe, Eishi H
Published: John Wiley & Sons Inc.,
Publisher Address: Singapore :
Publication Dates: 2015.
Literature type: Book
Language: English
Subjects:
Electronic circuits > Effect of radiation on
Integrated circuits > Ultra large scale integration > Reliability
Integrated circuits > Effect of radiation on
Carrier Form: xxiv, 268 pages : illustrations ; 25 cm
Bibliography: Includes bibliographical references and index.
ISBN: 9781118479292 (cloth : alk. paper) :
1118479297 (cloth : alk. paper)
Index Number: TK7870
CLC: TN4
Call Number: TN4/I125

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