Screen LibraryLow voltage electron microscopy principles and applications /
"Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for curre...
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| Group Author: | ; |
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| Published: |
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| Literature type: | Electronic eBook |
| Language: | English |
| Series: |
Royal microscopical society-Wiley series
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| Subjects: | |
| Online Access: |
http://onlinelibrary.wiley.com/book/10.1002/9781118498514 |
| Summary: |
"Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before"-- |
| Carrier Form: | 1 online resource : ill. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: |
9781118498514 (electronic bk.) 1118498518 (electronic bk.) 9781118498507 (e-book) 111849850X (e-book) 9781118498484 1118498488 |
| Index Number: | QH212 |
| CLC: | TN15 |
| Contents: | Introduction to the Theory and Advantages of Low Voltage Electron Microscopy / David C Bell, Natasha Erdman -- SEM Instrumentation Developments for Low kV Imaging and Microanalysis / Natasha Erdman, David C Bell -- Extreme High-Resolution (XHR) SEM Using a Beam Monochromator / Richard J Young, Gerard N A van Veen, Alexander Henstra, Lubomir Tuma -- The Application of Low-Voltage SEM : From Nanotechnology to Biological Research / Natasha Erdman, David C Bell -- Low Voltage High-Resolution Transmission Electron Microscopy / David C Bell -- Gentle STEM of Single Atoms: Low keV Imaging and Analysis at Ultimate Detection Limits / Ondrej L Krivanek, Wu Zhou, Matthew F Chisholm, Juan Carlos Idrobo, Tracy C Lovejoy, Quentin M Ramasse, Niklas Dellby -- Low Voltage Scanning Transmission Electron Microscopy of Oxide Interfaces / Robert Klie -- What's Next? The Future Directions in Low Voltage Electron Microscopy / David C Bell, Natasha Erdman. |