数字集成电路与嵌入式内核系统的测试设计 = Design-for-Test for Digital IC's and Embedded Core System
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Main Authors: | |
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Group Author: | ; |
Published: |
机械工业出版社
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Publisher Address: | 北京 |
Publication Dates: | 2006 |
Literature type: | Book |
Language: |
Chinese English |
Series: |
电子与电气工程丛书 |
Subjects: | |
Carrier Form: | 284页: ; 26cm光盘1片 |
ISBN: |
7-111-18706-7 7-89492-738-4 |
Index Number: | TN431 |
CLC: |
TN431.2 TP311.1 |
Call Number: | TN431.2/4254 |