Screen Library数字集成电路与嵌入式内核系统的测试设计 = Design-for-Test for Digital IC's and Embedded Core System
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| Main Authors: | |
|---|---|
| Group Author: | ; |
| Published: |
机械工业出版社
|
| Publisher Address: | 北京 |
| Publication Dates: | 2006 |
| Literature type: | Book |
| Language: |
Chinese English |
| Series: |
电子与电气工程丛书 |
| Subjects: | |
| Carrier Form: | 284页: ; 26cm光盘1片 |
| ISBN: |
7-111-18706-7 7-89492-738-4 |
| Index Number: | TN431 |
| CLC: |
TN431.2 TP311.1 |
| Call Number: | TN431.2/4254 |