Wafer level reliability of advanced CMOS devices and processes
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Group Author: | |
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Published: |
Nova Science Publishers,
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Publisher Address: | New York |
Publication Dates: | c2008. |
Literature type: | Book |
Language: | English |
Subjects: | |
Carrier Form: | 195 p.: ill. ; 26 cm. |
ISBN: |
9781604567137 (hardcover) 1604567139 (hardcover) |
Index Number: | TN386 |
CLC: | TN386.1 |
Call Number: | TN386.1/W128 |
Contents: | Includes bibliographical references and index. |