Screen LibraryWafer level reliability of advanced CMOS devices and processes
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| Group Author: | |
|---|---|
| Published: |
Nova Science Publishers,
|
| Publisher Address: | New York |
| Publication Dates: | c2008. |
| Literature type: | Book |
| Language: | English |
| Subjects: | |
| Carrier Form: | 195 p.: ill. ; 26 cm. |
| ISBN: |
9781604567137 (hardcover) 1604567139 (hardcover) |
| Index Number: | TN386 |
| CLC: | TN386.1 |
| Call Number: | TN386.1/W128 |
| Contents: | Includes bibliographical references and index. |