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Radiation effects and soft errors in integrated circuits and electronic devices /

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative en...

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Bibliographic Details
Corporate Authors: World Scientific Firm
Group Author: Schrimpf, Ronald Donald; Fleetwood, D. M. Dan M
Published: World Scientific Pub. Co.,
Publisher Address: Singapore ; Hackensack, N.J. :
Publication Dates: 2004.
Literature type: eBook
Language: English
Series: Selected topics in electronics and systems ; vol. 34
Subjects:
Electronic circuits > Effect of radiation on
Integrated circuits > Effect of radiation on
Electronic books
Online Access: http://www.worldscientific.com/worldscibooks/10.1142/5607#t=toc
Summary: This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal oxide semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes
Item Description: Also published in the International Journal of High Speed Electronics and Systems, v. 14, no. 2 (2004) p. 285-623.
Carrier Form: 1 online resource (viii,339pages) : illustrations.
Bibliography: Includes bibliographical references.
ISBN: 9789812794703 (electronic bk.)
CLC: TN4
Contents: Single event effects in avionics and on the ground / E. Normand -- Soft errors in commercial integrated circuits / R.C. Baumann -- Single-event effects in III-V semiconductor electronics / D. McMorrow, J.S. Melinger, and A.R. Knudson -- Investigation of single-event transients in fast integrated circuits with a pulsed laser / P. Fouillat ... [et al.] -- System level single event upset mitigation strategies / W.F. Heidergott -- Radiation-tolerant design for high performance mixed-signal circuits / W.T. Holman -- A total-sose hardening-by-design approach for high-speed mixed-signal CMOS integr

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