Cover is for reference only

Dimensional Optical Metrology and Inspection for Practical Applications X : 12-16 April 2021, Online Only, United States /

Saved in:
Bibliographic Details
Corporate Authors: Dimensional Optical Metrology and Inspection for Practical Applications (Conference) Online Only, United States); SPIE (Society)
Group Author: Harding, Kevin G.; Zhang, Song; Li, Beiwen
Published: SPIE,
Publisher Address: Bellingham, Washington :
Publication Dates: [2021]
Literature type: Book
Language: English
Series: Proceedings of SPIE, volume 11732
Subjects:
Optical measurements > Congresses.
Item Description: "At SPIE Defense + Commercial Sensing" -- Cover.
Carrier Form: 1 volume (various pagings) : illustrations ; 28 cm.
Bibliography: Includes bibliographical references.
ISBN: 9781510643017
CLC: TB96-532
Call Number: TB96-532/D582/2021

Related Book Recommendations