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Terrestrial radiation effects in ULSI devices and electronic systems /

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Bibliographic Details
Main Authors: Ibe, Eishi H
Published: John Wiley & Sons Inc.,
Publisher Address: Singapore :
Publication Dates: 2015.
Literature type: eBook
Language: English
Subjects:
Electronic circuits > Effect of radiation on
Integrated circuits > Ultra large scale integration > Reliability
Integrated circuits > Effect of radiation on
TECHNOLOGY & ENGINEERING > Mechanical
Electronic books
Online Access: http://onlinelibrary.wiley.com/book/10.1002/9781118479308
Carrier Form: 1 online resource.
Bibliography: Includes bibliographical references and index.
ISBN: 9781118479315
1118479319
9781118479322
1118479327
9781118479308
1118479300
1118479297
9781118479292
Index Number: TK7870
CLC: TN4

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