Screen LibraryScanning probe microscopy：atomic scale engineering by forces and currents
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| Main Authors: | |
|---|---|
| Corporate Authors: | |
| Group Author: | |
| Published: |
Springer Science+Business,
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| Publisher Address: | New York |
| Publication Dates: | c2006. |
| Literature type: | Book |
| Language: | English |
| Series: |
Nanoscience and technology |
| Subjects: | |
| Online Access: |
http://dx.doi.org/10.1007/0-387-37231-8 |
| Carrier Form: | xiv, 281 p.: ill. ; 25 cm. |
| ISBN: |
9780387372310 (electronic bk.) 0387372318 (electronic bk.) |
| Index Number: | TH742 |
| CLC: | TH742 |
| Contents: | Includes bibliographical references and index. |