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Summary of a workshop on the technology, policy and cultural dimensions of biometric systems

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Bibliographic Details
Corporate Authors: National Research Council U.S.. Whither Biometrics Committee; National Research Council U.S.. Division on Engineering and Physical Sciences; National Research Council U.S.. Computer Science and Telecommunications Board; National Academies Press U.S; Workshop on Technical, Policy, and Cultural Dimensions of Biometric Systems (2005 Washington, D.C.)
Group Author: Batch Kristen; Millett Lynette I; Pato Joseph N
Published: National Academies Press,
Publisher Address: Washington, D.C.
Publication Dates: c2006.
Literature type: Book
Language: English
Subjects:
Biometric identification
Carrier Form: xi, 47 p.: ; 28 cm.
Publication Frequency: Also issued online.
ISBN: 0309101255
9780309101257
Index Number: Q
CLC: Q-332
Call Number: Q-332/S955
Contents: "Workshop on Technical, Policy, and Cultural Dimensions of Biometric Systems, March 15-16, 2005, Washington, D.C."--P. 35.
Includes bibliographical references.

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