International Workshop on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 6-7 May 1993, Kiev, Ukraine
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Corporate Authors: | ; ; ; |
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Group Author: | ; ; |
Published: |
SPIE--the International Society for Optical Engineering,
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Publisher Address: | Bellingham, Wash., USA |
Publication Dates: | c1994. |
Literature type: | Book |
Language: | English |
Series: |
Proceedings / SPIE--the International Society for Optical Engineering ; v. 2113 |
Subjects: | |
Carrier Form: | ix, 252 p.: ill. ; 28 cm. |
ISBN: | 0819414069 |
Index Number: | TN2 |
CLC: | TN2-532 |
Call Number: | TN2-532/I618/1993 |
Contents: | Includes bibliographical references and index. |