Reset Filters
Language: Chinese

Cover is for reference only

Gettering and defect engineering in semiconductor technology XVI : selected, peer reviewed papers form the GADEST 2015 : Geetering and Defect Engineering in Semiconductor Technology, September 20-25, 2015, Bad Staffelstein, Germany /

Saved in:
Bibliographic Details
Corporate Authors: Geetering and Defect Engineering in Semiconductor Technology Bad Staffelstein, Germany
Group Author: Pichler, P. Peter
Published: Trans Tech Publications,
Publisher Address: Pfaffikon :
Publication Dates: [2016]
Literature type: Book
Language: English
Series: Solid state phenomena, volume 242
Subjects:
Semiconductors > Defects > Congresses
Getters > Congresses
Carrier Form: xii, 498 pages : illustrations, forms ; 24 cm.
Bibliography: Includes bibliographical references and indexes.
ISBN: 9783038356080 (paperback) :
3038356085 (paperback)
CLC: TN3-532
Call Number: TN3-532/G394/2015

Related Book Recommendations