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Point and extended defects in semiconductors

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Bibliographic Details
Corporate Authors: North Atlantic Treaty Organization. Scientific Affairs Division.; International School of Materials Science and Technology (1988 Erice, Italy) (Erice, Italy))
Group Author: Benedek G.; A. Cavallini A.; W. Schröter W.; (Wolfgang)
Published: Plenum Press,
Publisher Address: New York
Publication Dates: c1989.
Literature type: Book
Language: English
Series: NATO ASI series.. Series B,, PhysicsPhysics ; v. 202
Subjects:
Semiconductors > Congresses. > Congresses.
Carrier Form: x, 287 p.: ill. ; 26 cm.
ISBN: 0306433367
Index Number: TN303
CLC: TN303-532
Contents: "Proceedings of the NATO advanced research workshop/International School of Materials Science and Technology, Second Workshop on Point, Extended, and Surface Defects in Semiconductors, held November 2-7, 1988 in Erice, Italy"--T.p. verso.
"Published in cooperation with NATO Scientific Affairs Division."
Includes bibliographical references.

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