Microscopic identification of electronic defects in semiconductors:symposium held April 15-18, 1985, San Francisco, California, U.S.A.
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Corporate Authors: | |
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Group Author: | ; ; |
Published: |
Materials Research Society,
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Publisher Address: | Pittsburgh, Pa. |
Publication Dates: | c1985. |
Literature type: | Book |
Language: | English |
Series: |
Materials Research Society symposia proceedings ; v. 46 |
Subjects: | |
Carrier Form: | xv, 604 p.: ill. ; 24 cm. |
ISBN: | 0931837111 |
Index Number: | TN303 |
CLC: | TN303-532 |
Call Number: | TN303-53/M626/1985/ |
Contents: | Includes bibliographies and indexes. |