Diagnostic measurements in LSI/VLSI integrated circuits production
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Main Authors: | |
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Group Author: | ; |
Published: |
World Scientific,
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Publisher Address: | Singapore |
Publication Dates: | c1991. |
Literature type: | Book |
Language: | English |
Series: |
Advanced series in electrical and computer engineering ; vol. 7 |
Subjects: | |
Carrier Form: | xv, 356 p.: ill. ; 22 cm. |
ISBN: | 9810202822 |
Index Number: | TN47 |
CLC: | TN47 |
Call Number: | TN47/J25/ |