Cover is for reference only

Self-testing VLSI design

Saved in:
Bibliographic Details
Main Authors: Yarmolik V. N
Group Author: Kachan I. V
Published: Elsevier,
Publisher Address: Amsterdam
Publication Dates: 1993.
Literature type: Book
Language: English
Subjects:
Integrated circuits > Very large scale integration > Testing
Integrated circuits > Very large scale integration > Design
Carrier Form: xi, 345 p.: ill. ; 25 cm.
ISBN: 0444896406 (alk. paper)
Index Number: TN47
CLC: TN47
Call Number: TN47/Y28/
Contents: Includes bibliographical references (p. 329-341) and index.

Related Book Recommendations