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Author: sponsored by the IEEE Electron Devices Society and cooperatively sponsored by the IEEE Microwave Theory and Techniques Society

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2000 5th International Workshop on Statistical Metrology：IWSM : June 11, 2000/Hawaii

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Bibliographic Details
Corporate Authors: International Workshop on Statistical Metrology (5th 2000 Honolulu, Hawaii; IEEE Electron Devices Society
Published: IEEE,
Publisher Address: Piscataway, N.J.
Publication Dates: c2000.
Literature type: Book
Language: English
Subjects:
Semiconductors > Characterization > Statistical methods
Semiconductors > Measurement
Carrier Form: 83 p.: ill. ; 28 cm.
ISBN: 0780358961
Index Number: TB9
CLC: TB9-532
Call Number: TB9-532/I61/2000
Contents: "IEEE cat. no. 00TH8489"--T.p.
Includes bibliographical references.

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