Screen LibraryPhysical principles of electron microscopy：an introduction to TEM, SEM, and AEM
Saved in:
| Main Authors: | |
|---|---|
| Published: |
Springer Science+Business Media,
|
| Publisher Address: | New York |
| Publication Dates: | c2005. |
| Literature type: | Book |
| Language: | English |
| Subjects: | |
| Carrier Form: | xii, 202 p.: ill. ; 25 cm. |
| ISBN: | 0387258000 (hd.bd.) |
| Index Number: | TN16 |
| CLC: | TN16 |
| Call Number: | TN16/E293 |
| Contents: | Includes bibliographical references (p. [195]-196) and index. |