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Bibliographic Details
Corporate Authors: Reliability Analysis Center U.S; Rome Air Development Center
Published:
Literature type: Book
Language: English
Series: Microcircuit device reliability
Subjects:
Integrated circuits > Large scale integration > Reliability > Tables
Integrated circuits > Large scale integration > Testing > Tables
Item Description: Under contract to: Rome Air Development Center, F30602.
STRN: MDR-3, etc.
Carrier Form: 210 p. : ill. ; 28 cm.
Index Number: TK7874
CLC: TN406-64
Call Number: TN406-64/M533

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