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Author: Sachdev,Manoj

Author Results for Pineda de Gyvez José.

Pineda de Gyvez,José
Sachdev,Manoj
SpringerLink (Online service)
(荷)阿米尔·齐亚约(Amir Zjajo)，(荷)何塞·皮内达·德杰韦兹(José Pineda de Gyvez)著
Zjajo,Amir
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by Manoj Sachdev and José Pineda de Gyvez

1
Defect-oriented testing for nano-metric CMOS VLSI circuits

Cover is for reference only
Main Authors: Sachdev Manoj
Group Author: Pineda de Gyvez José
Published: Springer,
Publication Dates: c2007.
Call Number: TN432.07/S121/2nd.ed.
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2
Defect-oriented testing for nano-metric CMOS VLSI circuits

Cover is for reference only
Main Authors: Sachdev Manoj.
Corporate Authors: SpringerLink (Online service)
Group Author: Pineda de Gyvez José.
Published: Springer,
Publication Dates: c2007.
Book
Save to List
Saved in:
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