Discrete semiconductor reliability：transistor/diode data

Main Authors: Walker Roy C (prepared by Roy C. Walker, David B. Nicholls, Reliability Analysis Center (IIT Research Institute).)
Corporate Authors: IIT Research Institute; Reliability Analysis Center U.S
Group Author: Nicholls David B (joint author.)
Published: Reliability Analysis Center, Rome Air Development Center,
Publication Dates: 1977.
Call Number: TN32/R382/