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3
Polarization : measurement, analysis, and remote sensing XIV : 27 April-8 May 2020, online only, United States /

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Corporate Authors: SPIE Society
Group Author: Chenault, David B; Goldstein, Dennis H
Published: SPIE,
Publication Dates: [2020]
Call Number: O436.2-532/P762.1/2020
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4
Engine emission control technologies : design modifications and pollution mitigation techniques /

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Main Authors: Rao, G. Amba Prasad, 1966-
Group Author: Sharma, T. Karthikeya, 1985-
Published: Apple Academic Press,
Publication Dates: [2020]
Call Number: U464/R215
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5
Advances in metrology for X-ray and EUV optics VIII : 11-12 August 2019, San Diego, California, United States /

Cover is for reference only
Corporate Authors: SPIE Society
Group Author: Assoufid, Lahsen; Ohashi, Haruhiko; Asundi, Anand
Published: SPIE,
Publication Dates: [2019]
Call Number: TB96-532/A244-1/2019
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6
Post-processing techniques in antenna measurement /

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Group Author: Castañer, Manuel Sierra; Foged, Lars J
Published: SciTech Publishing,
Publication Dates: 2019.
Call Number: TN82/P857
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7
Polarization : measurement, analysis, and remote sensing XIII : 16-17 April 2018, Orlando, Florida, United States /

Cover is for reference only
Corporate Authors: SPIE Society
Group Author: Chenault, David B; Goldstein, Dennis H
Published: SPIE,
Publication Dates: [2018]
Call Number: O436.2-532/P762.1/2018
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8
Advances in metrology for X-ray and EUV optics VII : 6-7 August 2017, San Diego, California, United States /

Cover is for reference only
Corporate Authors: SPIE Society
Group Author: Assoufid, Lahsen; Ohashi, Haruhiko; Asundi, Anand
Published: SPIE,
Publication Dates: [2017]
Call Number: TB96-532/A244-1/2017
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9
Analog electronics for radiation detection /

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Group Author: Turchetta, Renato; Iniewski, Krzysztof
Published: CRC Press, Taylor & Francis Group,
Publication Dates: [2016]
Call Number: TL81/A532
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10
Polarization: measurement, analysis, and remote sensing XI : 5-6 May 2014, Baltimore, Maryland, United States /

Cover is for reference only
Corporate Authors: SPIE Society
Group Author: Chenault, David B; Goldstein, Dennis H
Published: SPIE,
Publication Dates: [2014]
Call Number: O436.2-532/P762.1/2014
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11
Advances in metrology for X-ray and EUV optics V : 18 August 2014, San Diego, California, United States /

Cover is for reference only
Corporate Authors: SPIE Society
Group Author: Assoufid, Lahsen; Ohashi, Haruhiko; Asundi, Anand
Published: SPIE,
Publication Dates: [2014]
Call Number: TB96-532/A244-1/2014
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12
Making your data center energy efficient how to save big on data center energy costs

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Main Authors: Held Gilbert 1943-
Published: CRC Press,
Publication Dates: c2012.
Call Number: C2-05/H474
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13
Advances in metrology for X-ray and EUV optics IV 12 August 2012, San Diego, California, United States

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Corporate Authors: SPIE Society
Group Author: Takacs Peter Z; Asundi Anand; Assoufid Lahsen
Published: SPIE,
Publication Dates: 2012.
Call Number: TB96-532/A244-1/2012
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14
Electronics for radiation detection

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Group Author: Iniewski Krzysztof
Published: CRC Press,
Publication Dates: c2011.
Call Number: O572.2/E387
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16
Advances in metrology for x-ray and EUV optics III 1-2 August 2010, San Diego, California, United States

Cover is for reference only
Corporate Authors: SPIE Society
Group Author: Takacs Peter Z; Asundi Anand; Assoufid Lahsen
Published: SPIE,
Publication Dates: c2010.
Call Number: TB96-532/A244-1/2010
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