2nd European Congress on Optics Applied to Metrology (METROP)：presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France

Corporate Authors: European Congress on Optics Applied to Metrology (2d 1979 Strasbourg; European Photonics Association; Society of Photo-Optical Instrumentation Engineers; Optics, Photonics, and Iconics Engineering Meeting (1979 Strasbourg, France)
Group Author: Meyrueis Patrick; Grosmann Michel
Published: Society of Photo-optical Instrumentation Engineers,
Publication Dates: c1980.
Call Number: TB9-53/E89/1979/