DFT 2005：20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : [proceedings] : 3-5 October, 2005, Monterey, California, USA

Corporate Authors: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (20th 2005 Monterey, California, USA; IEEE Computer Society. Fault-Tolerant Computing Technical Committee; IEEE Computer Society. Test Technology Technical Committee
Group Author: Aitken Robert
Published: IEEE Computer Society Press,
Publication Dates: 2005.
Call Number: TP302.8-532/I59/2005