Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits：[27 November-1 December 1995, Singapore]

Corporate Authors: International Symposium on the Physical & Failure Analysis of Integrated Circuits (5th 1995 Singapore; Institute of Microelectronics; Magnetics Technology Centre; IEEE Singapore Section. Reliability/CPMT/EDA Chapter; IEEE Electron Devices Society; National University of Singapore. Centre for IC Failure Analysis and Reliability
Group Author: Radhakrishnan M. K; Ong Soon Huat
Published: Institute of Electrical and Electronics Engineers,
Publication Dates: c1995.
Call Number: TN4-532/I61.6/1995/