Records of the 1999 IEEE International Workshop on Memory Technology, Design, and Testing, August 9-10, 1999, San Jose, California, USA

Corporate Authors: IEEE International Workshop on Memory Technology, Design, and Testing (1999 San Jose, Calif.); IEEE Computer Society; IEEE Computer Society. Test Technology Technical Committee.; IEEE Computer Society. Technical Committee on VLSI.; IEEE Solid-State Circuits Society.
Group Author: Rajsuman Rochit.; Wik T.; (Thomas)
Published: IEEE Computer Society Press,
Publication Dates: c1999.
Call Number: TP333.5-532/I59.1/1999/