Proceeding of the 15th International Symposium on the Physical & Failure Analysis of Integrated Circuits：IPFA 2008

Corporate Authors: International Symposium on the Physical and Failure Analysis of Integrated Circuits (15th 2008 Singapore
Group Author: Lip Gan Chee; Radhakrishnan M. K
Published: IEEE Reliability Society,
Publication Dates: c2008.
Call Number: TN4-532/I61.6/2008